{
  "docId": "019de513-776f-750e-bad5-9e1451563c27",
  "docSlug": "4e05ceba642a850531e6035ce4709fcb",
  "documentTitle": "KLA | Investor Day Presentation Deck | 142 slides",
  "authorId": "kla",
  "authorName": "KLA",
  "documentKindSlug": "conference-presentation",
  "documentKindLabel": "Conference presentation",
  "sourceTypeSlug": "investor_relations",
  "sourceTypeLabel": "Investor relations",
  "presentationDate": "2022-06-01 00:00:00",
  "orientation": "landscape",
  "aspectRatio": 1.7777778,
  "pageNumber": 55,
  "pageCount": 120,
  "prevPage": 54,
  "nextPage": 56,
  "slideType": "kpi_overview",
  "function": "summarize",
  "density": "overcrowded",
  "nDataPoints": 5,
  "notes": "The slide uses a series of big-number metrics to demonstrate market dominance in EUV inspection.",
  "elementsJson": null,
  "metadataConfidence": 1,
  "imagePath": null,
  "slideHref": "/slides/019de513-776f-750e-bad5-9e1451563c27/55",
  "deckHref": "/decks/019de513-776f-750e-bad5-9e1451563c27",
  "deckJsonHref": "/decks/019de513-776f-750e-bad5-9e1451563c27.json",
  "deckAnchorHref": "/decks/019de513-776f-750e-bad5-9e1451563c27#slide-55",
  "components": [
    {
      "bbox": {
        "h": 0.3,
        "w": 0.8,
        "x": 0.1,
        "y": 0.55
      },
      "kind": "image",
      "text": "Product imagery of KLA inspection systems",
      "attrs": null,
      "subkind": "photo",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "a979f0f1-b007-41d6-ac3b-6d8acc00f073",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.2,
        "w": 0.18,
        "x": 0.03,
        "y": 0.2
      },
      "kind": "metric",
      "text": ">$2.2B",
      "attrs": null,
      "subkind": "big-number",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "101cc0cf-6b03-4bbb-a0a7-f303a8b29fe1",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.2,
        "w": 0.18,
        "x": 0.22,
        "y": 0.2
      },
      "kind": "metric",
      "text": ">30",
      "attrs": null,
      "subkind": "big-number",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "526bd100-e8af-451d-a4d9-a85944592d7c",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.2,
        "w": 0.18,
        "x": 0.6,
        "y": 0.2
      },
      "kind": "metric",
      "text": ">85%",
      "attrs": null,
      "subkind": "big-number",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "540c6222-6f47-4b30-a8b0-ae4040a021b5",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.2,
        "w": 0.18,
        "x": 0.41,
        "y": 0.2
      },
      "kind": "metric",
      "text": ">50",
      "attrs": null,
      "subkind": "big-number",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "7edc5de8-c314-44fb-bc10-1dbcf20b1d07",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.2,
        "w": 0.18,
        "x": 0.79,
        "y": 0.2
      },
      "kind": "metric",
      "text": ">300",
      "attrs": null,
      "subkind": "big-number",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "e8529b9c-95ce-4830-b5e2-8855dd389f91",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.18,
        "x": 0.6,
        "y": 0.35
      },
      "kind": "subtitle",
      "text": "Percent of EUV reticles inspected by KLA in HVM",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "0147384f-2ea0-4243-8ed9-1f5461a214a4",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.18,
        "x": 0.79,
        "y": 0.35
      },
      "kind": "subtitle",
      "text": "Die-to-database systems installed worldwide with >90% market share",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "02be4446-1338-45ae-8ce8-5c213e029c78",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.18,
        "x": 0.41,
        "y": 0.35
      },
      "kind": "subtitle",
      "text": "Teron™ SL670e systems + Gen5 Print Check systems shipped (IC fab)",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "49b6f25a-83b9-48e1-b523-873e7491ec00",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.18,
        "x": 0.22,
        "y": 0.35
      },
      "kind": "subtitle",
      "text": "Teron™ 640e systems shipped (mask shop)",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "9823fd5f-f6e4-47a4-9512-282b4ccddf56",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.18,
        "x": 0.03,
        "y": 0.35
      },
      "kind": "subtitle",
      "text": "Cumulative KLA EUV reticle qualification revenue",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "f6203984-b260-4068-acd7-13bfd49de2ec",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.05,
        "w": 0.4,
        "x": 0.3,
        "y": 0.86
      },
      "kind": "title",
      "text": "Semi PC enables EUV in HVM",
      "attrs": null,
      "subkind": "action-title",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "529a8234-a023-462a-be52-e547e6a01067",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.08,
        "w": 0.5,
        "x": 0.03,
        "y": 0.05
      },
      "kind": "title",
      "text": "Semi PC EUV Reticle Inspection Summary",
      "attrs": null,
      "subkind": "headline",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "dcaee91a-a076-4e32-b1ac-b2747c331d15",
      "frameworkName": null,
      "frameworkSlug": null
    }
  ],
  "metrics": [],
  "tools": [],
  "frameworks": [],
  "arcBeats": [
    {
      "to": 80,
      "from": 21,
      "beatId": "cd7a7548-0c5e-4aec-bc98-9384ca3ec1b6",
      "arcName": "Monroe's Motivated Sequence",
      "arcSlug": "monroes-sequence",
      "beatName": "Satisfaction",
      "beatSlug": "monroes-sequence-satisfaction",
      "evidence": "The deck showcases KLA's solutions, innovation, and collaboration, demonstrating satisfaction of the need for sustainable outperformance.",
      "position": 2,
      "confidence": 0.8,
      "parentBeatName": "Turn",
      "parentBeatSlug": "turn"
    }
  ],
  "loops": [
    {
      "to": 120,
      "from": 8,
      "name": "Before After",
      "slug": "21-before-after",
      "bestFor": "Product demos, process improvements, ROI justification",
      "matchId": "7f47b633-24ac-444c-9ab0-c06ad9addaca",
      "evidence": "The deck uses multiple 'before-after' slides to demonstrate KLA's growth and progress.",
      "position": 0,
      "objective": "Highlighting KLA's progress and growth",
      "structure": "The Old Way (Pain) -> The Moment of Change -> The New Way (Glory) -> The Measurable Delta",
      "confidence": 0.8,
      "description": "Show the dramatic contrast between the old way and the new way through side-by-side comparison"
    }
  ],
  "imagePathAlt": null,
  "thumbSrc": null,
  "thumbSrcAlt": null,
  "locked": true
}