{
  "docId": "019de511-8748-721b-b9db-af8d130b54ce",
  "docSlug": "9635cf71b4eb6818a1102711db7d89a9",
  "documentTitle": "KLA | Investor Conference Presentation Deck | 30 slides",
  "authorId": "kla",
  "authorName": "KLA",
  "documentKindSlug": "conference-presentation",
  "documentKindLabel": "Conference presentation",
  "sourceTypeSlug": "investor_relations",
  "sourceTypeLabel": "Investor relations",
  "presentationDate": "2021-09-01 00:00:00",
  "orientation": "landscape",
  "aspectRatio": 1.7777778,
  "pageNumber": 14,
  "pageCount": 30,
  "prevPage": 13,
  "nextPage": 15,
  "slideType": "problem_statement",
  "function": "diagnose_problem",
  "density": "dense",
  "nDataPoints": 0,
  "notes": "The slide uses a process flow diagram for Process Control and icons for Electrical Test to illustrate current industry standards.",
  "elementsJson": null,
  "metadataConfidence": 1,
  "imagePath": null,
  "slideHref": "/slides/019de511-8748-721b-b9db-af8d130b54ce/14",
  "deckHref": "/decks/019de511-8748-721b-b9db-af8d130b54ce",
  "deckJsonHref": "/decks/019de511-8748-721b-b9db-af8d130b54ce.json",
  "deckAnchorHref": "/decks/019de511-8748-721b-b9db-af8d130b54ce#slide-14",
  "components": [
    {
      "bbox": {
        "h": 0.25,
        "w": 0.42,
        "x": 0.034,
        "y": 0.35
      },
      "kind": "diagram",
      "text": "Process Control flow with Coat, Expose, Etch, Clean, Fill, CMP steps and Inspect and Measure feedback loop",
      "attrs": null,
      "subkind": "process",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "45ac57ee-201b-490f-8d70-feb3e9cd56de",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.25,
        "w": 0.35,
        "x": 0.55,
        "y": 0.3
      },
      "kind": "image",
      "text": "Wafer probe and final test icons",
      "attrs": null,
      "subkind": "illustration",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "84c33639-81c8-40ee-bf58-85edc9f7b18c",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.4,
        "x": 0.55,
        "y": 0.66
      },
      "kind": "paragraph",
      "text": "Identifies devices that don't function or are outside parametric limits. Test coverage gaps, ambiguity and latent defects",
      "attrs": null,
      "subkind": "paragraph",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "440adbb5-7481-434d-81bf-b2454edc7453",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.1,
        "w": 0.4,
        "x": 0.042,
        "y": 0.66
      },
      "kind": "paragraph",
      "text": "Identifies sources of manufacturing defects by sub-sampling a percentage of inline wafers. Not all wafers or die are measured",
      "attrs": null,
      "subkind": "paragraph",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "4da0b4c9-cb6f-460c-a581-a27c59d0e0bf",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.045,
        "w": 0.415,
        "x": 0.038,
        "y": 0.058
      },
      "kind": "title",
      "text": "Existing Methods for Quality and Reliability",
      "attrs": null,
      "subkind": "headline",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "0bb03bbf-16ec-4ec6-98a2-e58849d11b11",
      "frameworkName": null,
      "frameworkSlug": null
    }
  ],
  "metrics": [],
  "tools": [
    {
      "name": "Problem Statement Canvas",
      "slug": "problem-statement-canvas",
      "agent": "Architect",
      "layer": "slide",
      "matchId": "a359f718-824b-4e94-b736-b730d2f35449",
      "evidence": "The slide presents a problem statement with a clear description of the issue and supporting information.",
      "confidence": 0.7
    }
  ],
  "frameworks": [
    {
      "name": "process",
      "slug": null,
      "matchId": "cdd3704f-7e0f-44e3-925b-96fb2d26b475",
      "evidence": "The slide uses a linear process flow diagram to describe manufacturing steps.",
      "confidence": 0.8
    }
  ],
  "arcBeats": [
    {
      "to": 20,
      "from": 13,
      "beatId": "b414cb52-6258-45a8-b889-e4aabf62e1f3",
      "arcName": "Problem-Agitate-Solution",
      "arcSlug": "problem-agitate-solution",
      "beatName": "Solution (Provide relief)",
      "beatSlug": "problem-agitate-solution-solution-provide-relief",
      "evidence": "The deck provides a solution with KLA's new inline screening standard and product solutions.",
      "position": 2,
      "confidence": 0.8,
      "parentBeatName": "Resolution",
      "parentBeatSlug": "resolution"
    }
  ],
  "loops": [],
  "imagePathAlt": null,
  "thumbSrc": null,
  "thumbSrcAlt": null,
  "locked": true
}