{
  "docId": "019dd923-622c-750b-8b9a-0f4bec37392f",
  "docSlug": "f982379e2e48",
  "documentTitle": "Lasertec Corporation (6920)",
  "authorId": "58_Scorpion_Capital",
  "authorName": "Scorpion Capital",
  "documentKindSlug": "activist-deck",
  "documentKindLabel": "Activist deck",
  "sourceTypeSlug": "short_seller",
  "sourceTypeLabel": "Short seller",
  "presentationDate": "2024-06-05 00:00:00",
  "orientation": "landscape",
  "aspectRatio": 1.3333334,
  "pageNumber": 197,
  "pageCount": 334,
  "prevPage": 196,
  "nextPage": 198,
  "slideType": "expose_contradiction",
  "function": "expose_contradiction",
  "density": "dense",
  "nDataPoints": 0,
  "notes": "The slide uses a specific example of a technical presentation to cast doubt on the credibility of Intel's mask inspection tool performance claims.",
  "elementsJson": [
    "paragraph",
    "screenshot",
    "line_chart"
  ],
  "metadataConfidence": 0.95,
  "imagePath": null,
  "slideHref": "/slides/019dd923-622c-750b-8b9a-0f4bec37392f/197",
  "deckHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f",
  "deckJsonHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f.json",
  "deckAnchorHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f#slide-197",
  "components": [
    {
      "bbox": null,
      "kind": "callout",
      "text": "Amusingly, however, the chart for the tool’s uptime omits the Y-axis units entirely - a cliche case of “How To Lie With Statistics.”",
      "attrs": null,
      "subkind": null,
      "toolName": "Visual emphasis",
      "toolSlug": "visual-emphasis",
      "confidence": null,
      "componentId": "019dd953-78b6-764f-bc86-74fed8cd7c65",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.45,
        "w": 0.86,
        "x": 0.07,
        "y": 0.49
      },
      "kind": "image",
      "text": "2021 SPIE presentation by Intel and Lasertec",
      "attrs": null,
      "subkind": "screenshot",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "575a47a9-06b5-46c3-bc46-ebab71353c22",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.08,
        "w": 0.28,
        "x": 0.08,
        "y": 0.715
      },
      "kind": "legend",
      "text": "Missing Y-axis for uptime – units not even defined and no numbers",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "23d05129-b74e-44d2-a452-da2af431b87c",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.38,
        "w": 0.86,
        "x": 0.07,
        "y": 0.07
      },
      "kind": "paragraph",
      "text": "We first realized that something is amiss as we read Intel’s EUV mask inspection presentations at SPIE, the main industry association. We noted three presentations by Safak Sayan, a ~20-year Intel veteran per his LinkedIn profile and who we believe to be the head of Intel’s mask shop. The presentations are typically co-authored with Lasertec employees, and seem rather eager to convey that the tools Intel purchased actually do work. For example, a 2021 presentation gives itself an A+ grade for EUV mask inspection, with the final sentence of the paper proclaiming that “No major development will be required to meet future needs such as higher sensitivity and throughput.” Amusingly, however, the chart for the tool’s uptime omits the Y-axis units entirely - a cliche case of “How To Lie With Statistics.”",
      "attrs": null,
      "subkind": "paragraph",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "ac9479d2-3b89-4f03-94d7-5eb38934b66d",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": null,
      "kind": "quote",
      "text": "“No major development will be required to meet future needs such as higher sensitivity and throughput.” — 2021 SPIE presentation by Intel and Lasertec",
      "attrs": null,
      "subkind": null,
      "toolName": "Authority citation",
      "toolSlug": "authority-citation",
      "confidence": null,
      "componentId": "019dd953-78b6-764f-bc86-790b4a85cd53",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.03,
        "w": 0.8,
        "x": 0.07,
        "y": 0.95
      },
      "kind": "source-note",
      "text": "Source: : https://www.linkedin.com/in/safak-sayan/https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11609/116090L/Laser-assisted-discharge-produced-plasma-LDP-EUV-source-for-actinic/10.1117/12.2588788.full",
      "attrs": {
        "numbered": true
      },
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "87eaea85-9f24-4391-91e5-a665dc02f20b",
      "frameworkName": null,
      "frameworkSlug": null
    }
  ],
  "metrics": [],
  "tools": [],
  "frameworks": [
    {
      "name": "fraud-exposure",
      "slug": null,
      "matchId": "a45f7c78-b04d-45ff-8995-14738387494d",
      "evidence": "The slide explicitly calls out a 'cliche case of How To Lie With Statistics' to expose potential deception.",
      "confidence": 0.9
    }
  ],
  "arcBeats": [],
  "loops": [],
  "imagePathAlt": null,
  "thumbSrc": null,
  "thumbSrcAlt": null,
  "locked": true
}