{
  "docId": "019dd923-622c-750b-8b9a-0f4bec37392f",
  "docSlug": "f982379e2e48",
  "documentTitle": "Lasertec Corporation (6920)",
  "authorId": "58_Scorpion_Capital",
  "authorName": "Scorpion Capital",
  "documentKindSlug": "activist-deck",
  "documentKindLabel": "Activist deck",
  "sourceTypeSlug": "short_seller",
  "sourceTypeLabel": "Short seller",
  "presentationDate": "2024-06-05 00:00:00",
  "orientation": "landscape",
  "aspectRatio": 1.3333334,
  "pageNumber": 166,
  "pageCount": 334,
  "prevPage": 165,
  "nextPage": 167,
  "slideType": "expose_contradiction",
  "function": "expose_contradiction",
  "density": "dense",
  "nDataPoints": 0,
  "notes": "The slide highlights the repetitive use of the word 'simulation' in the source text as evidence of a lack of real-world validation.",
  "elementsJson": [
    "paragraph",
    "screenshot",
    "callout_box"
  ],
  "metadataConfidence": 1,
  "imagePath": null,
  "slideHref": "/slides/019dd923-622c-750b-8b9a-0f4bec37392f/166",
  "deckHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f",
  "deckJsonHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f.json",
  "deckAnchorHref": "/decks/019dd923-622c-750b-8b9a-0f4bec37392f#slide-166",
  "components": [
    {
      "bbox": {
        "h": 0.15,
        "w": 0.25,
        "x": 0.67,
        "y": 0.485
      },
      "kind": "callout",
      "text": "“Simulation” or “Simulator” is used six times in the short paragraph on the A300’s High NA inspection performance",
      "attrs": null,
      "subkind": "primary",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "5dda0ab5-c036-4bfb-9157-f6ae936aa90c",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": null,
      "kind": "callout",
      "text": "\"Simulation\" or \"Simulator\" is used six times in the short paragraph on the A300's High NA inspection performance",
      "attrs": null,
      "subkind": null,
      "toolName": "Visual emphasis",
      "toolSlug": "visual-emphasis",
      "confidence": null,
      "componentId": "019dd953-78b6-764f-bc84-adf2b567f922",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.45,
        "w": 0.58,
        "x": 0.07,
        "y": 0.45
      },
      "kind": "image",
      "text": "Excerpt from Lasertec SPIE paper",
      "attrs": null,
      "subkind": "screenshot",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "6ee185e2-e84a-4391-907c-04ff3a8af07e",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.25,
        "w": 0.86,
        "x": 0.07,
        "y": 0.13
      },
      "kind": "paragraph",
      "text": "Instead, the paper resorts to a mathematical model versus actual results from using the machine, repeatedly using the word “simulation” or its variant: “imaging simulations using a rigorous optical simulator with electromagnetic calculations with conditions of circular illumination...in this simulation, A3XX shows a significant improvement in contrast....” If the A300 and its High NA technology were real, Lasertec engineers would have presented more credible information, similar to ASML, Zeiss, and others.",
      "attrs": null,
      "subkind": "paragraph",
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "aeee5735-5926-4ffc-9919-ece170c4df86",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": null,
      "kind": "quote",
      "text": "To assess the inspection capability of the High-NA ACTIS A3XX, we performed imaging simulations using a rigorous optical simulator with electromagnetic calculations with conditions of circular illumination and a standard TaBn-based absorber with a thickness of 70 nm. In this simulation, A3XX shows a significant improvement in contrast, with more than 30% improvement for 30 nm half-pitch line-and-space and 64 nm contact holes. — Lasertec SPIE paper on ACTIS A300 High NA capabilities, Nov 21, 2023",
      "attrs": null,
      "subkind": null,
      "toolName": "Authority citation",
      "toolSlug": "authority-citation",
      "confidence": null,
      "componentId": "019dd953-78b6-764f-bc84-b33d537426b3",
      "frameworkName": null,
      "frameworkSlug": null
    },
    {
      "bbox": {
        "h": 0.05,
        "w": 0.75,
        "x": 0.07,
        "y": 0.94
      },
      "kind": "source-note",
      "text": "Source: https://www.spiedigitallibrary.org/conference-proceedings-of-spie/12751/1275102/Actinic-pattern-mask-inspection-for-high-NA-EUV-lithography/10.1117/12.2686350.short?webSyncID=9e6ec7a4-9dab-6a0c-bad0-59329ad883c9&sessionGUID=d902bc99-93ce-d268-bead-49a28531ab0d",
      "attrs": null,
      "subkind": null,
      "toolName": null,
      "toolSlug": null,
      "confidence": null,
      "componentId": "c9aec81a-e8aa-4cf1-baad-4975fa659da3",
      "frameworkName": null,
      "frameworkSlug": null
    }
  ],
  "metrics": [],
  "tools": [],
  "frameworks": [
    {
      "name": "fraud-exposure",
      "slug": null,
      "matchId": "b312f7fa-a6da-4d54-9986-0356b6595b5b",
      "evidence": "The slide explicitly labels the lack of empirical data as a 'red flag' and questions the existence of the technology.",
      "confidence": 0.9
    }
  ],
  "arcBeats": [],
  "loops": [],
  "imagePathAlt": null,
  "thumbSrc": null,
  "thumbSrcAlt": null,
  "locked": true
}